Single-ended D flip-flop with implicit scan mux for high performance mobile AP

A novel high-speed single-ended D flip-flop based on a SR(set/reset)-type latch is presented in this paper. The SR-type latch is adapted to implement a dynamic stage for high-speed operation and modified to add a scan mux without setup time degradation on a data path. The proposed flip-flop enables to achieve the high-speed operation having the comparable hold time characteristics to a conventional master-slave flip-flop without any writeability issue at low voltage. The simulated and the measured results were made using a 14nm FinFET process. The data-to-output latency of the proposed flip-flop decreased by 51% while the power delay product improved by 41% as compared with the master-slave flip-flop. A test chip was fabricated in SS, TT, FF, SF and FS process corners and tested at −25C and 100C with a 50mV voltage step from 0.45V to 1.00V. It indicates both the master-slave and the proposed flip-flops can work down to 0.50V whereas conventional pulse-based flip-flops have writeability problems at 0.60V. Two product-level CPU designs were also fabricated for performance comparison, leading to 8.5% speed improvement by applying the proposed high-speed flip-flop.