Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate

Hideki Murakami,Yoshikazu Moriwaki,Masafumi Fujitake,Daisuke Azuma,Seiichiro Higashi,Seiichi Miyazaki

Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate

2005

Hideki Murakami
Yoshikazu Moriwaki
Masafumi Fujitake
Daisuke Azuma
Seiichiro Higashi
Seiichi Miyazaki

A molded foam plastic plate packing box for china plates of different sizes has a bottom and lid each with opposite cooperating circular ridges between which a plate is confined.

Keywords:

Ridge
Crystallite
Electronic engineering
Atom
Engineering

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