Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer
1991
Abstract A capacitively coupled silicon strip detector with 50 μm readout pitch has been tested in a pion beam at CERN. The spatial resolution of the detector equipped with LSI readout chips was 4.9 μm and the most probable signal-to-single-channel noise ratio was 31.
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