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EMI Noise Source Characterization for SiC and GaN Power Transistors in Synchronous Rectification DC-DC Converter
EMI Noise Source Characterization for SiC and GaN Power Transistors in Synchronous Rectification DC-DC Converter
2020
Takaaki Ibuchi
Tsuyoshi Funaki
Keywords:
Power semiconductor device
dc dc converter
Rectification
Optoelectronics
source characterization
EMI
Materials science
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