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A method for analyzing transient processes in semiconductor devices subjected to high-power pulsed irradiation
A method for analyzing transient processes in semiconductor devices subjected to high-power pulsed irradiation
1981
V.N. Murashev
K. P. Gurov
Iu. G. Miller
Keywords:
Mechanics
Electric current
Poisson's equation
Continuity equation
Boundary value problem
Irradiation
Transient response
Nonlinear system
Semiconductor device
Materials science
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