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Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films
Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films
2017
Jim Fitch
Robbyn Trappen
Chih-Yeh Huang
Jinling Zhou
Guerau Cabrera
Shuai Dong
Shalini Kumari
Mikel Holcomb
James M. LeBeau
Keywords:
Thin film
Analytical chemistry
X-ray absorption spectroscopy
Materials science
Valence (chemistry)
Condensed matter physics
depth dependence
Nanotechnology
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