Electrical properties of polycrystalline mercuric iodide detector

Potentially low cost and large area polycrystalline mercuric iodide is one of the preferred materials for the fabrication of room temperature X-ray and gamma-ray detectors. The properties of the contact between electrode and film play an important role in the performance of the polycrystalline mercuric iodide detector. The crystalline structure of the as-deposited polycrystalline α-HgI 2 films were characterized by XRD. The surface morphology of the films was obtained by optical microscope and scan electron microscopes (SEM). And the I-V curve and the response to 241Am were measured after evaporating Au electrode. The energy resolution of 241Am α particles at room temperature was obtained.