Analytical electron microscopy of silver halide photographic systems

Abstract Studies of silver halide (AgX) photographic materials and individual microcomponents by TEM/STEM/SEM/EDX, CL, EFTEM/EELS and digital image analysis techniques are reviewed. Electron-beam–AgX interactions are discussed to clarify relationships between the signals analysed in various operating AEM modes. An optimum strategy of structural and analytical diagnosis of complex silver halide photographic systems by a number of AEM methods is considered, using a number of examples (colour and black-and-white films, AgX microcrystals, and colour coupler dispersions). AEM applications to study of the main stages of the photographic process, i.e. chemical ripening, spectral sensitisation, latent image formation and development are also presented. Current trends and future directions in research of AgX-based photographic systems by AEM techniques are outlined.