Minimum-duty-ratio semiconductor laser peak value optical power testing device and method

The invention discloses a minimum-duty-ratio semiconductor laser peak value optical power testing device and method, and the method comprises the steps that a high-speed photovoltaic conversion and pre-amplification module carries out the photovoltaic conversion of an optical signal of a high-speed laser pulse and the pre-amplification of a signal, thereby generating a high-speed electric pulse signal; the electric pulse signal is transmitted to a high-speed pulse optical maintaining and sampling module and a high-speed pulse frequency and widening testing module; the high-speed pulse optical maintaining and sampling module carries out the maintaining and sampling of the high-speed electric pulse signal, generates an integral maintaining signal, solves a pulse mean power, and transmits the pulse mean power to an FPGA controller; and the high-speed pulse frequency and widening testing module achieves the accurate measurement of frequency and pulse width of the high-speed electric pulse signal, and enables the measurement data to be transmitted to the FPGA controller. The method can achieve the detection of the peak value of a narrow pulse width pulse signal with shorter rise time and minimum duty ratio, and can achieve the instrumentation.