Determination Structural Properties of In-Doped CdTe/CdS Thin Films Solar Cells

Many methods have been used to produce thin film solar cells. Many of these methods are technically complex and expensive. In the present study, a thermal evaporation method with fewer usage parameters was used to produce thin film solar cells. In addition, the impacts of annealing on the structure of solar cells were investigated. The surface morphology of solar cells and the approximate content of each element were carried out with a QUANTA (FEG-250) model scanning electron microscopy and Energy Dispersive X-Ray Spectroscopy (SEM/EDS).The X-ray diffraction (XRD) measurements was performed using a BRUKER XRD system (D8 Advance) X-ray diffractometer. In the SEM analyzes, it was determined that the reduced in the roughness of the film surfaces was and clumping occurred as a result of annealing. But if the crystallite size is at submicron level, this negative situation can be overlooked. An increase in Cd was observed with EDS analysis. XRD diffraction has shown that the peaks in the (111), (200) and (211) planes increase the intensity of these peaks in the annealing result. As a result, it was determined that annealing affects positively the structural characteristics of In-doped CdTe/CdS solar cells.