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Atul Chittora
Atul Chittora
GlobalFoundries
Computer science
Real-time computing
Engineering
Electronic engineering
Pattern recognition
5
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8
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0
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Fast, high-capacity critical area analysis (CAA) with advanced FINFET defectivity calculation
2021
Xiaoyuan Qi
Atul Chittora
Aaron Sinnott
Binod Kumar G. Nair
Shobhit Malik
Jeffrey E. Nelson
Jac Condella
Jonathan R. Fales
Rwik Sengupta
Ya-Chieh Lai
Frank E. Gennari
Philippe Hurat
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Fault Isolation using Layout Pattern Analysis
2020
Atul Chittora
Neerja Bawaskar
Shobhit Malik
Monisa Ramesh Babu
Fadi Batarseh
Janam Bakshi
Davide Pacifico
Shenghua Song
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Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data
2017
ATS | Asian Test Symposium
Wu-Tung Cheng
Randy Klingenberg
Brady Benware
Wu Yang
Manish Sharma
Geir Eide
Yue Tian
Sudhakar M. Reddy
Yan Pan
Sherwin Fernandes
Atul Chittora
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Pylon: Towards an integrated customizable volume diagnosis infrastructure
2016
ITC | International Test Conference
Yan Pan
Rao Desineni
Kannan Sekar
Atul Chittora
Sherwin Fernandes
Neerja Bawaskar
John M. Carulli
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DiagBridge: Analyzing scan diagnosis data in a yield perspective
2014
ASMC | Advanced Semiconductor Manufacturing Conference
Yan Pan
Atul Chittora
Kannan Sekar
Shobhit Malik
Lim Seng Keat
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