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Kannan Sekar
Kannan Sekar
GlobalFoundries
Engineering
Electronic engineering
Real-time computing
Manufacturing engineering
manufacturing process
5
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3
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0
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Yield Learning for Complex FinFET Defect Mechanisms Based on Volume Scan Diagnosis Results
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Huaxing Tang
Manish Sharma
Wu-Tung Cheng
Gaurav Veda
Douglas Gehringer
Matt Knowles
Jayant D'Souza
Kannan Sekar
Neerja Bawaskar
Yan Pan
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Early Testable Addressable Logic (ETAL) Test Structure: Showcasing the use of an Alternate Logic Yield Learning Test Structure for Technology Development
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Ishtiaq Ahsan
Daniel Greenslit
Bill Evans
Toni Laaksonen
Tarl Gordon
Zhigang Song
Yandong Liu
John Masnik
Frank Barth
Shahrukh Khan
Joerg Winkler
Kannan Sekar
Neerja Bawaskar
Steve Crown
Kan Zhang
Martin O'tool
Teng-Yin Lin
Mark Lagus
DK Sohn
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IC layout weak point effectiveness evaluation based on statistical methods
2018
VTS | VLSI Test Symposium
Fang Lin
Ali Ahmadi
Kannan Sekar
Yan Pan
Ke Huang
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Pylon: Towards an integrated customizable volume diagnosis infrastructure
2016
ITC | International Test Conference
Yan Pan
Rao Desineni
Kannan Sekar
Atul Chittora
Sherwin Fernandes
Neerja Bawaskar
John M. Carulli
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DiagBridge: Analyzing scan diagnosis data in a yield perspective
2014
ASMC | Advanced Semiconductor Manufacturing Conference
Yan Pan
Atul Chittora
Kannan Sekar
Shobhit Malik
Lim Seng Keat
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