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Ricardo Basco
Ricardo Basco
Intel
NMOS logic
CMOS
Y-factor
Electrical engineering
Noise-figure meter
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Noise performance of 90 nm CMOS technology
2004
IMS | International Microwave Symposium
D. Becher
Gaurab Banerjee
Ricardo Basco
Celia Hung
Kelin J. Kuhn
Wei-Kai Shih
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Citations (6)
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