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S.X. Ren
S.X. Ren
Oak Ridge National Laboratory
Analytical chemistry
Diffraction
Materials science
Misorientation
Crystallography
3
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126
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Texture formation and grain boundary networks in rolling assisted biaxially textured substrates and in epitaxial YBCO films on such substrates
1999
Micron
Amit Goyal
S.X. Ren
E.D. Specht
D. M. Kroeger
R. Feenstra
David P. Norton
M. Paranthaman
D.F. Lee
D. K. Christen
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Citations (84)
Exploring Spatial Resolution in Electron Back-Scattered Diffraction Experiments via Monte Carlo Simulation
1998
Microscopy and Microanalysis
S.X. Ren
E.A. Kenik
K.B. Alexander
Amit Goyal
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Citations (41)
Monte Carlo simulation of spatial resolution for electron backscattered diffraction (EBSD) with application to two-phase materials
1997
S.X. Ren
E.A. Kenik
K. B. Alexander
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Citations (1)
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