Old Web
English
Sign In
Acemap
>
authorDetail
>
J. Peschke
J. Peschke
Freescale Semiconductor
Electronic engineering
Nanocrystal
Non-volatile memory
Statistical fluctuations
Chemistry
3
Papers
25
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Impacts of process induced interfacial defects on gate oxide integrity
2008
IRPS | International Reliability Physics Symposium
N. Liu
A. Haggag
J. Peschke
M. Moosa
C. Weintraub
H. Lazar
G. Campbell
A. Srivastava
J. Liu
J. Porter
K. Picone
J. Parrish
J. Jiang
Show All
Source
Cite
Save
Citations (0)
Influence of silicon nanocrystal size and density on the performance of non-volatile memory arrays
2005
Solid-state Electronics
Rajesh A. Rao
Horacio P. Gasquet
Robert F. Steimle
G. Rinkenberger
S. Straub
R. Muralidhar
S.G.H. Anderson
Jane A. Yater
J.C. Ledezma
J. Hamilton
B. Acred
Craig T. Swift
B. Hradsky
J. Peschke
Michael A. Sadd
Erwin J. Prinz
K.M. Chang
B.E. White
Show All
Source
Cite
Save
Citations (22)
Nanocrystal physical attributes influencing non-volatile memory performance
2005
DRC | Device Research Conference
B. Hradsky
R. Muralidhar
Rajesh A. Rao
B. Steimle
S. Straub
Bruce E. White
Michael A. Sadd
S.G.H. Anderson
Jane A. Yater
Craig T. Swift
B. Acred
J. Peschke
Erwin J. Prinz
K.M. Chang
Show All
Source
Cite
Save
Citations (3)
1