Old Web
English
Sign In
Acemap
>
authorDetail
>
Alexander Krokhmal
Alexander Krokhmal
Wafer
Analytical chemistry
Synchrotron
Diffraction
Metrology
3
Papers
6
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Crystalline damage in silicon wafers and 'rare event' failure introduced by low-energy mechanical impact
2017
Materials Science in Semiconductor Processing
F. Atrash
I. Meshi
Alexander Krokhmal
Paul Ryan
Matthew Wormington
D. Sherman
Show All
Source
Cite
Save
Citations (4)
A Novel X‐ray Diffraction and Reflectivity Tool for Front‐End of Line Metrology
2011
Matthew Wormington
Boris Yokhin
David Berman
Alexander Krokhmal
Isaac Mazor
Paul Ryan
John Wall
Richard Bytheway
Show All
Source
Cite
Save
Citations (2)
Compact X‐ray Tool For Critical‐Dimension Metrology
2009
Boris Yokhin
Alexander Krokhmal
Alexander Dikopoltsev
David Berman
Isaac Mazor
Byoung-Ho Lee
Dongchul Ihm
Kwang Hoon Kim
Show All
Source
Cite
Save
Citations (0)
1