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Ira Leventhal
Ira Leventhal
Applied Materials
Computer science
Artificial intelligence
Machine learning
Deep learning
Real-time computing
5
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1
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Automated Socket Anomaly Detection through Deep Learning
2020
ITC | International Test Conference
Nidhi Agrawal
Min Jian Yang
Constantinos Xanthopoulos
Vijayakumar Thangamariappan
Joe Xiao
Chee Wah Ho
Keith Schaub
Ira Leventhal
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Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion
2019
ITC | International Test Conference
Kosuke Ikeda
Keith Schaub
Ira Leventhal
Yiorgos Makris
Constantinos Xanthopoulos
Deepika Neethirajan
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Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion
2019
ITC | International Test Conference
Kosuke Ikeda
Keith Schaub
Ira Leventhal
Yiorgos Makris
Constantinos Xanthopoulos
Deepika Neethirajan
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IP Session on Machine Learning Applications in IC Test-Related Tasks.
2019
VTS | VLSI Test Symposium
Ghada Sokar
Yassien Zakaria
Asmaa Rabie
Kareem Madkour
Ira Leventhal
Jochen Rivoir
Xinli Gu
Haralampos-G. Stratigopoulos
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Machine Learning-based Noise Classification and Decomposition in RF Transceivers.
2019
VTS | VLSI Test Symposium
Deepika Neethirajan
Constantinos Xanthopoulos
Kiruba Sankaran Subramani
Keith Schaub
Ira Leventhal
Yiorgos Makris
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