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Hung Son Nguyen
Hung Son Nguyen
Nanyang Technological University
Dielectric
Electromigration
Electronic engineering
Engineering
Electrical breakdown
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Reliability studies of barrier layers for Cu/PAE low-k interconnects
2006
Microelectronics Reliability
Hung Son Nguyen
Zhenghao Gan
Zhe Chen
V. Chandrasekar
K. Prasad
Subodh Mhaisalkar
N. Jiang
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