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Hans P. Muhlfeld

IBM

4

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Cosmic ray soft error rates of 16-Mb DRAM memory chips

1998 IEEE Journal of Solid-state Circuits
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Accelerated testing for cosmic soft-error rate

1996 Ibm Journal of Research and Development
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IBM experiments in soft fails in computer electronics (1978–1994)

1996 Ibm Journal of Research and Development
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Field testing for cosmic ray soft errors in semiconductor memories

1996 Ibm Journal of Research and Development
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Citations (156)