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Steve Currie
Steve Currie
Mayo Clinic
Physics
Electronic engineering
Electronic circuit
Heterojunction bipolar transistor
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3
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161
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Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)
2005
IEEE Transactions on Nuclear Science
Paul W. Marshall
M.A. Carts
Steve Currie
Robert A. Reed
Barb Randall
Karl Fritz
Krystal Kennedy
Melanie D. Berg
Ramkumar Krithivasan
Christina Siedleck
Ray Ladbury
Cheryl J. Marshall
John D. Cressler
Guofu Niu
Kenneth A. LaBel
Barry Kent Gilbert
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Citations (82)
A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS
2004
IEEE Transactions on Nuclear Science
Paul W. Marshall
Matty Carts
A.B. Campbell
Ray Ladbury
Robert A. Reed
Cheryl J. Marshall
Steve Currie
Dale McMorrow
Steve Buchner
Christina Seidleck
Pam Riggs
Karl Fritz
Barb Randall
Barry Kent Gilbert
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Citations (31)
An SEU hardening approach for high-speed SiGe HBT digital logic
2003
IEEE Transactions on Nuclear Science
Ramkumar Krithivasan
Guofu Niu
John D. Cressler
Steve Currie
Karl Fritz
Robert A. Reed
Paul W. Marshall
Pamela A. Riggs
Barbara A. Randall
Barry Kent Gilbert
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Citations (48)
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