Old Web
English
Sign In
Acemap
>
authorDetail
>
Pam Riggs
Pam Riggs
Mayo Clinic
Silicon-germanium
Electrical engineering
Bipolar junction transistor
Materials science
Cutoff frequency
2
Papers
34
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS
2004
IEEE Transactions on Nuclear Science
Paul W. Marshall
Matty Carts
A.B. Campbell
Ray Ladbury
Robert A. Reed
Cheryl J. Marshall
Steve Currie
Dale McMorrow
Steve Buchner
Christina Seidleck
Pam Riggs
Karl Fritz
Barb Randall
Barry Kent Gilbert
Show All
Source
Cite
Save
Citations (31)
Broad Beam and Ion Microprobe Studies of Single-Event Upsets in High Speed 0.18micron Silicon Germanium Heterojunction Bipolar Transistors and Circuits
2003
Robert A. Reed
Paul W. Marshall
Jim C. Pickel
Martin A. Carts
Tim Irwin
Guofu Niu
John D. Cressler
Ramkumar Krithivasan
Karl Fritz
Pam Riggs
Show All
Source
Cite
Save
Citations (3)
1