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Y. Chen
Y. Chen
Texas Instruments
Electronic engineering
Semiconductor device
Microscopy
Materials science
Scanning capacitance microscopy
3
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20
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Phenomenological model for "stress memorization" effect from a capped-poly process
2005
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
L. S. Adam
C. Chiu
M. Huang
Xin Wang
Y. Wang
S. Singh
Y. Chen
H. Bu
J. Wu
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Citations (5)
SCM and SSRM Study on Boron Penetration and SSR Channel Formation in Sub‐100nm MOSFETs
2005
Characterization and Metrology for ULSI Technology
Y.G. Wang
H. Bu
L. Adam
J. Wu
Y. Chen
K. Liu
Song Zhao
Shaoping Tang
D. B. Scott
C. Machala
T. Rost
Hal Edwards
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Transistor optimization for leakage power management in a 65 nm CMOS technology for wireless and mobile applications
2004
VLSIT | Symposium on VLSI Technology
Song Zhao
A. Chatterjee
Shaoping Tang
Jong Shik Yoon
Sue E. Crank
H. Bu
Theodore W. Houston
Kayvan Sadra
Amitabh Jain
Y. Wang
D. Redwine
Y. Chen
Shirin Siddiqui
Gary Zhang
T. Laaksonen
C. Hall
S. Chang
Leif Christian Olsen
T. Riley
C. Meek
I. Hossain
J. Rosal
Alwin J. Tsao
J. Wu
David B. Scott
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Citations (15)
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