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Wei Su
Wei Su
Thailand Ministry of Industry
Condensed matter physics
Stress concentration
Composite material
Gate dielectric
MISFET
3
Papers
10
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0
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Hydrogen effects on AlGaN/GaN MISFET with LPCVD-SiNx gate dielectric
2019
Semiconductor Science and Technology
Zhiyuan He
Yiqiang Chen
Jiang He
Wei Su
Wenxiao Fang
Yunfei En
Yun Huang
Yang Liu
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Failure Analysis Examination of the Effect of Thermal Cycling on Copper-filled TSV Interposer Reliability
2018
ICEPT | International Conference on Electronic Packaging Technology
Yuan Chen
Wei Su
Peng Zhang
Xiao ling Lin
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Investigation of abrupt degradation of drain current caused by under-gate crack in AlGaN/GaN high electron mobility transistors during high temperature operation stress
2015
Journal of Applied Physics
Chang Zeng
Xueyang Liao
Ruguan Li
YuanSheng Wang
Yiqiang Chen
Wei Su
Yuan Liu
Li Wei Wang
Ping Lai
Yun Huang
Yunfei En
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Citations (8)
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