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Jeroen Deleu
Jeroen Deleu
Rutherford backscattering spectrometry
Materials science
Thin layers
Analytical chemistry
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Characterization of Ultra Thin Layers by Rutherford Backscattering Spectrometry
1999
Bert Brijs
Jeroen Deleu
T. Connard
Hua Li
R. Loo
M. Caymax
Kaoru Nakajima
Kenji Kimura
W. Vandervorst
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