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David S. Marx
David S. Marx
Rudolph Technologies, Inc.
Metrology
Process control
Wafer
Electronic engineering
Chip-scale package
2
Papers
2
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0
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Through silicon via process characterization by integrated inspection/metrology solutions in visible and infrared domain
2015
ASMC | Advanced Semiconductor Manufacturing Conference
Nicolas Devanciard
Stephane Rey
Thomas Magis
Stephane Minoret
Carlos Beitia
Dario Alliata
David S. Marx
Prasad Bachiraju
Darcy Hart
John Thornell
Russ Dudley
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Automated Metrology Improves Productivity and Yields for Wafer Level Packaging in High Volume Manufacturing
2014
Jin You Zao
Bong Yin Yen
Lim Beng Kuan
John Thornell
Darcy Hart
David S. Marx
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