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S. Gausepohl
S. Gausepohl
MOSFET
Electronic engineering
Stress (mechanics)
Temperature instability
Process optimization
2
Papers
14
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Advanced contact and junction technologies for improved parasitic resistance and short channel immunity in FinFETs beyond 22nm node
2011
ISDRS | International Semiconductor Device Research Symposium
K.-W. Ang
Byoung Gi Min
M. Gunji
P.Y. Hung
I. Ok
M. Rodgers
D. L. Franca
S. Gausepohl
C. Hobbs
P. D. Kirsch
R. Jammy
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Citations (2)
Negative-bias temperature instability cure by process optimization
2006
IEEE Transactions on Electron Devices
A. Scarpa
D Ward
Jerome Guillaume Anna Dubois
L. van Marwijk
S. Gausepohl
R. Campos
Kwang Ye Sim
A. Cacciato
R. Kho
M. Bolt
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Citations (12)
1