Old Web
English
Sign In
Acemap
>
authorDetail
>
E. van der Vegt
E. van der Vegt
NXP Semiconductors
Electronic engineering
Electromigration
Engineering
Semiconductor device fabrication
Annealing (metallurgy)
5
Papers
11
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Characterization and modeling of program/erase induced device degradation in 2T-FNFN-NOR flash memories
2008
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Guoqiao Tao
Helene Chauveau
D. Boter
E. van der Vegt
D. Dormans
Rob Verhaar
Show All
Source
Cite
Save
Citations (5)
Embedded FLASH memory thermal budget impact on core CMOS 90nm devices
2007
ESSDERC | European Solid-State Device Research Conference
J.-P. Carrere
F. Larman
E. van der Vegt
M. Bocat
N. Auriac
N. Cherault
M. Charleux
K. Rochereau
M. Hopstaken
R. Pantel
D. Boter
D. Dormans
Show All
Source
Cite
Save
Citations (2)
Lead-Free Solders for Application in Automotive Electronics
2004
W.G. Sloof
Mh Biglari
J. Kiersch
E. van der Vegt
M Biglari
Show All
Source
Cite
Save
Citations (0)
Impact of process steps on electrical and electromigration performances of copper interconnects in damascene architecture
2000
Microelectronics Reliability
R. Gonella
J Torres
P. Motte
E. van der Vegt
J.M Gilet
Show All
Source
Cite
Save
Citations (2)
Process steps impact on electrical and electromigration performances of dual damascene copper
2000
IIRW | International Integrated Reliability Workshop
R. Gonella
J Torres
P. Motte
E. van der Vegt
J.M Gilet
Show All
Source
Cite
Save
Citations (2)
1