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J.-P. Carrere
J.-P. Carrere
Electronic engineering
Gate oxide
Plasma
PMOS logic
Materials science
3
Papers
5
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New circuit model for investigating plasma damage in FDSOI devices
2014
IRPS | International Reliability Physics Symposium
M. Akbal
G. Ribes
T. Poiroux
J.-P. Carrere
L. Vallier
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Citations (3)
Embedded FLASH memory thermal budget impact on core CMOS 90nm devices
2007
ESSDERC | European Solid-State Device Research Conference
J.-P. Carrere
F. Larman
E. van der Vegt
M. Bocat
N. Auriac
N. Cherault
M. Charleux
K. Rochereau
M. Hopstaken
R. Pantel
D. Boter
D. Dormans
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Citations (2)
Decoupled plasma nitridation of ultra-thin gate oxides for 60-90 nm technologies
2003
M. Bidaud
J.-P. Carrere
F. Bœuf
C. Dachs
C. Parthasarathy
F. Guyader
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