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M. Suzuki
M. Suzuki
IMEC
Optoelectronics
Ferroelectricity
Trapping
Materials science
Nanotechnology
4
Papers
19
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Understanding of Tunable Selector Performance in Si-Ge-As-Se OTS Devices by Extended Percolation Cluster Model Considering Operation Scheme and Material Design
2020
VLSIT | Symposium on VLSI Technology
S. Kabuyanagi
Daniele Garbin
Andrea Fantini
Sergiu Clima
Robin Degraeve
G. L. Donadio
Wouter Devulder
Romain Delhougne
D. Cellier
A. Cockburn
W. G. Kim
Mahendra Pakala
M. Suzuki
Ludovic Goux
Gouri Sankar Kar
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Citations (2)
Impact of Charge trapping on Imprint and its Recovery in HfO 2 based FeFET
2019
IEDM | International Electron Devices Meeting
Y. Higashi
L. Di Piazza
M. Suzuki
D. Linten
J. Van Houdt
Nicolo Ronchi
Ben Kaczer
K. Banerjee
S.R.C. McMitchell
Barry O'Sullivan
Sergiu Clima
A. Minj
Umberto Celano
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Citations (11)
Impact of Charge trapping on Imprint and its Recovery in HfO 2 based FeFET
2019
Yusuke Higashi
L. Di Piazza
M. Suzuki
D. Linten
J. Van Houdt
Nicolo Ronchi
Ben Kaczer
K. Banerjee
S.R.C. McMitchell
Barry OSullivan
Sergiu Clima
A. Minj
Umberto Celano
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New Insights into the Imprint Effect in FE-HfO2 and its Recovery.
2019
IRPS | International Reliability Physics Symposium
Y. Higashi
K. Florent
A. Subirats
Ben Kaczer
L. Di Piazza
Sergiu Clima
Nicolo Ronchi
S. R. C. McMitchell
K. Banerjee
Umberto Celano
M. Suzuki
D. Linten
J. Van Houdt
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Citations (6)
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