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Peggy Mulski
Peggy Mulski
Motorola
Electromigration
Atomic physics
Ranging
Current density
Phenomenon
3
Papers
17
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Blech effect in single-inlaid Cu interconnects
2001
IITC | International Interconnect Technology Conference
S. Thrasher
C. Capasso
Larry Zhao
R. Hernandez
Peggy Mulski
Stewart Rose
Timothy Nguyen
H. Kawasaki
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Citations (11)
Dependence of EM performance on linewidth for Cu dual-inlaid structures
2000
Larry Zhao
C. Capasso
Amit P. Marathe
S. Thrasher
R. Hernandez
Peggy Mulski
Stewart Rose
Timothy Nguyen
Martin Gall
H. Kawasaki
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Citations (3)
Electromigration Failure Modes and Blech Effect in Single-Inlaid Cu Interconnects
2000
S. Thrasher
C. Capasso
Larry Zhao
R. Hernandez
Peggy Mulski
Stewart Rose
Timothy Nguyen
H. Kawasaki
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Citations (3)
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