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Jang Sim
Jang Sim
IBM
Engineering
Reliability engineering
Manufacturing engineering
Composite number
Macro
2
Papers
1
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0
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Inline electrical yield versus optical inspection: Correlations, connections and disconnections
2016
ASMC | Advanced Semiconductor Manufacturing Conference
Fan Zheng
Dave Salvador
Cathy Gow
Lori Kermel
Bryan Rhoads
Kan Zhang
Xiao Pan
Ben Stahl
William Davies
Amanda Tessier
Edward Crawford
Rebekah Sheraw
Ishtiaq Ahsan
Brett Engel
Brad Austin
Yongchun Xin
Jang Sim
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The importance of reporting both composite and maze yield for process split yield learning
2014
ASMC | Advanced Semiconductor Manufacturing Conference
Fan Zheng
Amanda L. Piper
Gauri Karve
Kan Zhang
Yongchun Xin
Jang Sim
Jason J. Mazzotti
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