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William Davies
William Davies
GlobalFoundries
Electronic engineering
Logic gate
Engineering
Signal
Reliability engineering
2
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8
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Inline electrical yield versus optical inspection: Correlations, connections and disconnections
2016
ASMC | Advanced Semiconductor Manufacturing Conference
Fan Zheng
Dave Salvador
Cathy Gow
Lori Kermel
Bryan Rhoads
Kan Zhang
Xiao Pan
Ben Stahl
William Davies
Amanda Tessier
Edward Crawford
Rebekah Sheraw
Ishtiaq Ahsan
Brett Engel
Brad Austin
Yongchun Xin
Jang Sim
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In-line characterization of EDRAM for a FINFET technology using VC inspection
2016
ASMC | Advanced Semiconductor Manufacturing Conference
Oliver D. Patterson
Richard F. Hafer
Surbhi Mittal
Ankur Arya
Kenneth Stein
Herbert L. Ho
William Davies
Xiaohu Tang
Brian Yueh-Ling Hsieh
Shuen-Cheng Chris Lei
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Citations (8)
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