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Jinchul Park
Jinchul Park
Samsung
Engineering
Instability
Passivation
Stacking fault
Electronic engineering
2
Papers
1
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High-speed and Ultra-low Power IoT One-chip (MCU + Connectivity-chip) on a Robust 28-nm Embedded Flash Process
2019
VLSIT | Symposium on VLSI Technology
Chang-Min Jeon
JongSung Woo
KyongSik Yeom
Minji Seo
Eun-Mi Hong
Young-cheon Jeong
Sangjin Lee
Hong-Kook Min
DalHwan Kim
HyunChang Lee
Soomin Cho
MyeongHee Oh
Ji-Sung Kim
Hyo Sang Lee
Jinchul Park
Cheol-min Kim
Hyuk-Jun Sung
Seong-Ho Yoon
Joonsuk Kim
Yong-kyu Lee
Ki-Chul Park
Gitae Jeong
Jong Shik Yoon
E. S. Jung
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Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism
2015
IRPS | International Reliability Physics Symposium
Jongwoo Park
Miji Lee
Hanbyul Kang
Wooram Ko
Eunkyeong Choi
Junsik Im
Minwoo Lee
Dohwan Chung
Jinchul Park
Sang-chul Shin
Sangwoo Pae
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