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Hong-Kook Min
Hong-Kook Min
Samsung
Electronic engineering
Transistor
Engineering
Parallel computing
Internet of Things
4
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10
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High-speed and Ultra-low Power IoT One-chip (MCU + Connectivity-chip) on a Robust 28-nm Embedded Flash Process
2019
VLSIT | Symposium on VLSI Technology
Chang-Min Jeon
JongSung Woo
KyongSik Yeom
Minji Seo
Eun-Mi Hong
Young-cheon Jeong
Sangjin Lee
Hong-Kook Min
DalHwan Kim
HyunChang Lee
Soomin Cho
MyeongHee Oh
Ji-Sung Kim
Hyo Sang Lee
Jinchul Park
Cheol-min Kim
Hyuk-Jun Sung
Seong-Ho Yoon
Joonsuk Kim
Yong-kyu Lee
Ki-Chul Park
Gitae Jeong
Jong Shik Yoon
E. S. Jung
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High-speed and logic-compatible split-gate embedded flash on 28-nm low-power HKMG logic process
2017
VLSIT | Symposium on VLSI Technology
Yong-kyu Lee
Chang-Min Jeon
Hong-Kook Min
Bo-Young Seo
K. Kim
Dong-Hyun Kim
Kyung-Soo Min
JongSung Woo
Hyunug Kang
Yong-Seok Chung
Min Su Kim
Jaejune Jang
KyongSik Yeom
Ji-Sung Kim
MyeongHee Oh
Hyo Sang Lee
Sunghee Cho
Duck-Hyung Lee
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Highly Scalable 2nd-Generation 45-nm Split-Gate Embedded Flash with 10-ns Access Time and 1M-Cycling Endurance
2016
IMW | International Memory Workshop
Yong-kyu Lee
Hong-Kook Min
Chang-Min Jeon
Bo-Young Seo
Ga-Young Lee
Eunkang Park
Dong-Hyun Kim
Changhyun Park
Baeseong Kwon
Minsu Kim
Bongsang Lee
Duck-Hyung Lee
Hyo Sang Lee
Jisung Kim
Sung-Hee Cho
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Citations (2)
Robust pad layout to improve wire bonding reliability
2011
IRPS | International Reliability Physics Symposium
Kyoung-Hwan Kim
Hong-Kook Min
Se Yeoul Park
So Ra Park
Seung-Jin Yang
Byung Sup Shim
Yong-Tae Kim
Jeong-Uk Han
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