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William Richardson
William Richardson
University of Central Florida
Electrical resistivity and conductivity
Thin film
Epitaxy
Sapphire
Annealing (metallurgy)
3
Papers
12
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Resistivity size effect due to surface steps on ruthenium thin films computed with a realistic tight-binding model
2021
Journal of Applied Physics
William Richardson
Eduardo R. Mucciolo
Patrick K. Schelling
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Epitaxial metals for interconnects beyond Cu
2020
Journal of Vacuum Science and Technology
Katayun Barmak
Sameer Ezzat
Ryan Gusley
Atharv Jog
Sit Kerdsongpanya
Asim Khaniya
Erik Milosevic
William Richardson
Kadir Sentosun
Amirali Zangiabadi
Daniel Gall
William E. Kaden
Eduardo R. Mucciolo
Patrick K. Schelling
Alan C. West
Kevin R. Coffey
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Citations (11)
Epitaxial metals for interconnects beyond Cu
2020
Journal of Vacuum Science and Technology
Katayun Barmak
Sameer Ezzat
Ryan Gusley
Atharv Jog
Sit Kerdsongpanya
Asim Khaniya
Erik Milosevic
William Richardson
Kadir Sentosun
Amirali Zangiabadi
Daniel Gall
William E. Kaden
Eduardo R. Mucciolo
Patrick K. Schelling
Alan C. West
Kevin R. Coffey
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Cite
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Citations (1)
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