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Soon Huat Lim
Soon Huat Lim
Advanced Micro Devices
Engineering
Fault detection and isolation
Semiconductor
Electronic engineering
Scheduling (production processes)
3
Papers
28
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Resolving systematic voltage sensitive soft failures in 28nm microprocessor devices
2014
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Dnyan Khatri
Soon Huat Lim
Mun Yee Ho
Vinod Narang
Dakshina-Murthy Srikanteswara
Keith Kasprak
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Citations (3)
Recent advances in fault isolation for semiconductor industry
2013
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
J.M. Chin
Vinod Narang
M.Y. Tay
Shei Lay Phoa
Ravikumar Venkat
Lwin Hnin Ei
Soon Huat Lim
Chea-Wei Teo
Syahirah Zulkifli
Wen Qiu
Joseph Tan
Gopi Ranganathan
Zi Ying Oh
Fang Jie Foo
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Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview
2011
Microelectronics Reliability
J.M. Chin
Vinod Narang
Xiaole Zhao
M.Y. Tay
Angeline Phoa
Venkat Krishnan Ravikumar
Lwin Hnin Ei
Soon Huat Lim
Chea-Wei Teo
Syahirah Zulkifli
Mei Chyn Ong
Ming Chuan Tan
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Citations (23)
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