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Kitty van Dijk
Kitty van Dijk
NXP Semiconductors
Electronic engineering
Non-volatile memory
Engineering
Leakage (electronics)
Process control
2
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3
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0
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Junction Optimization for Embedded 40nm FN/FN Flash Memory
2015
IMW | International Memory Workshop
Alessandro Baiano
Michiel van Duuren
Erik van der Vegt
Bob Schippers
Robert H. Beurze
Daniel Tajari Mofrad
Hans van Zwol
Yu Chen
Jed Chiang
Han Lokker
Kitty van Dijk
Jouke Verbree
Yi Ning Chen
Jochen Garbe
Rob Verhaar
D. Dormans
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Citations (2)
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes
2004
Microelectronics Reliability
Guoqiao Tao
A. Scarpa
Leo van Marwijk
Kitty van Dijk
F.G. Kuper
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Citations (1)
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