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Jiyou Fu
Jiyou Fu
ASML Holding
Computer science
Metrology
Wafer
Calibration
Criticality
2
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2024
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Stochastic defect criticality prediction enabled by physical stochastic modeling and massive metrology
2021
ChangAn Wang
Peigen Cao
Maxence Delorme
Jen-Yi Wuu
Jiyou Fu
Fuming Wang
Bob Lin
Yiqiong Zhao
Yi-Hsing Peng
Fan Yongfa
Mu Feng
Bin Cheng
Jen-Shiang Wang
Mark Simmoms
Stefan Hunsche
Oliver D. Patterson
Kuo-Feng Pao
Abdalmohsen Elmalk
Kevin Gao
Ruochong Fei
Xuefeng Zeng
Xiaolong Zhang
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Contour-based variability decomposition for stochastic band metrology
2021
Wallow Thomas I
Jiyou Fu
Jiao Liang
Jen-Shiang Wang
Jimmy Fan
Maxence Delorme
ChangAn Wang
Fahong Li
Vivek Kumar Jain
Rui Yuan
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