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D. Naso
D. Naso
Ophthalmology
Internal medicine
Cardiology
Medicine
Family medicine
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Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.
2007
Microelectronics Reliability
D. Corso
S. Aurite
E. Sciacca
D. Naso
Salvatore Lombardo
Antonello Santangelo
Maria Concetta Nicotra
Salvatore Cascino
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