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Nathan Havercroft
Nathan Havercroft
Secondary ion mass spectrometry
Analytical chemistry
Resolution (mass spectrometry)
Materials science
high mass
2
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1
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0
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Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces
2020
Microscopy and Microanalysis
Felix Kollmer
Alexander Pirkl
Sven Kayser
Henrik Arlinghaus
Rudolf Moellers
Nathan Havercroft
Ewald Niehuis
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TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel
2018
Microscopy and Microanalysis
Felix Kollmer
Nathan Havercroft
Anja Henss
Henrik Arlinghaus
Wolfgang Paul
Rudolf Moellers
E. Niehuis
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