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Ewald Niehuis
Ewald Niehuis
semiconductor industry
Nanotechnology
Inorganic chemistry
Chemistry
X-ray photoelectron spectroscopy
2
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1
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Surface analysis in the semiconductor industry: Present use and future possibilities
2020
Surface and Interface Analysis
Paul van der Heide
Valentina Spampinato
Alexis Franquet
Charlotte Zborowski
Thierry Conard
Jonathan Ludwig
Kristof Paredis
Wilfried Vandervorst
Alexander Pirkl
Ewald Niehuis
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Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces
2020
Microscopy and Microanalysis
Felix Kollmer
Alexander Pirkl
Sven Kayser
Henrik Arlinghaus
Rudolf Moellers
Nathan Havercroft
Ewald Niehuis
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