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Charlotte Zborowski
Charlotte Zborowski
Katholieke Universiteit Leuven
X-ray photoelectron spectroscopy
Spectral line
Materials science
semiconductor industry
Nanotechnology
3
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Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two- and three-parameter cross-sections
2021
Surface and Interface Analysis
Charlotte Zborowski
Sven Tougaard
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HAXPES of GaN film on Si with Cr Kα photons
2021
Surface Science Spectra
Anja Vanleenhove
Charlotte Zborowski
Inge Vaesen
I. Hoflijk
Thierry Conard
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Surface analysis in the semiconductor industry: Present use and future possibilities
2020
Surface and Interface Analysis
Paul van der Heide
Valentina Spampinato
Alexis Franquet
Charlotte Zborowski
Thierry Conard
Jonathan Ludwig
Kristof Paredis
Wilfried Vandervorst
Alexander Pirkl
Ewald Niehuis
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