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Shadi Sabri

Durham University

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Performance and Reliability Impacts of Extended Epitaxial Defects on 4H-SiC Power Devices

2018 Materials Science Forum
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Static and Dynamic Characterization of a 3.3 Kv, 45 A 4H-Sic MOSFET

2018 Materials Science Forum
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Short-Circuit Degradation of 10-kV 10-A SiC MOSFET

2017 IEEE Transactions on Power Electronics
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