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Reza Mahmoudi
Reza Mahmoudi
Shiraz University
Process variation
Reliability (semiconductor)
Reliability engineering
Electronic circuit
Logic gate
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Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment
2021
IEEE Access
Mohsen Raji
Reza Mahmoudi
Behnam Ghavami
Saeed Keshavarzi
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