Old Web
English
Sign In
Acemap
>
authorDetail
>
D. S. Pickard
D. S. Pickard
National University of Singapore
Analytical chemistry
Materials science
Helium
Field ion microscope
Nanotechnology
5
Papers
13
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Nanopatterning with the Helium Ion Microscope
2012
Microscopy and Microanalysis
D. S. Pickard
V. Viswanathan
C. Fang
Z. Ai
H. Hao
Y. Wang
Michel Bosman
J. Dorfmüller
H. Giessen
Show All
Source
Cite
Save
Citations (0)
Design, fabrication and Helium Ion Microscope patterning of suspended nanomechanical graphene structures for NEMS applications
2011
TRANSDUCERS | International Conference on Solid-State Sensors, Actuators and Microsystems
M. Annamalai
S. Mathew
V. Viswanathan
C. Fang
D. S. Pickard
Moorthi Palaniapan
Show All
Source
Cite
Save
Citations (8)
Graphene Nanoribbons Fabricated by Helium Ion microscope
2010
Bulletin of the American Physical Society
D. S. Pickard
B. Oezyilmaz
John T. L. Thong
Kian Ping Loh
V. Viswanathan
A. Zhongkai
Sinu Mathew
T. Kundu
C. Park
Z Yi
Xiangfan Xu
Kaiwen Zhang
T.C. Tat
H. Wang
T. Venkatesan
G Botton
M. Couillard
Show All
Source
Cite
Save
Citations (0)
Secondary electron detection for distributed axis electron beam systems
2008
Microelectronic Engineering
Sayaka Tanimoto
D. S. Pickard
C. Kenney
R. F. W. Pease
Show All
Source
Cite
Save
Citations (3)
Demonstration of Secondary Electron Detection using Monolithic Multi-Channel Electron Detector
2007
MNC | International Microprocesses and Nanotechnology Conference
Sayaka Tanimoto
D. S. Pickard
C. Kenney
J. Hasi
R. F. W. Pease
Show All
Source
Cite
Save
Citations (2)
1