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H. Kitamura
H. Kitamura
NEC
Physics
Electromigration
Tin
Analytical chemistry
Drift velocity
3
Papers
27
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In-situ side-view observation of electromigration in layered Al lines by ultrahigh voltage transmission electron microscopy
2008
H. Okabayashi
H. Kitamura
M. Komatsu
Hiroaki Mori
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Citations (7)
A high-performance 0.18-/spl mu/m merged DRAM/Logic technology featuring 0.45-/spl mu/m/sup 2/ stacked capacitor cell
1999
IEDM | International Electron Devices Meeting
M. Hamada
K. Inoue
R. Kubota
M. Takeuchi
Masato Sakao
H. Abiko
H. Kawamoto
Hiromu Yamaguchi
H. Kitamura
S. Onishi
K. Koyanagi
K. Mikagi
Koji Urabe
Tetsuya Taguwa
T. Yamamoto
N. Nagai
I. Shirakawa
S Kishi
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Citations (2)
Behavior of electromigration‐induced gaps in a layered Al line observed by in situ sideview transmission electron microscopy
1996
Applied Physics Letters
H. Okabayashi
H. Kitamura
M. Komatsu
Hiroaki Mori
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Citations (18)
1