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Jeff Dumas
Jeff Dumas
Electronic engineering
Materials science
NMOS logic
High-κ dielectric
Gate oxide
2
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2
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Impact of wafer thinning on High-K Metal Gate 20nm devices
2013
ECTC | Electronic Components and Technology Conference
Adam Beece
Rahul Agarwal
Sandhya Chandrashekhar
Jagar Singh
Siddhartha Siddhartha
Ramakanth Alapati
Biju Parameshwaran
Jeff Dumas
Tyson Alvanos
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IMPROVED EMC/EMI PERFORMANCE USING ACTIVE ANALOGUE POWER FILTERS
2008
Electronics world and wireless world
Jeff Dumas
Bob Lanoue
Bishara Tahhan
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