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Camille Xu
Camille Xu
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Computer science
Dram
Failure rate
Metrology
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Impacts Single Patterning ILT for Advanced Memory Challenging Design
2021
CSTIC | China Semiconductor Technology International Conference
Camille Xu
Jingjing Liu
Zhen Shi
Xudong Zhu
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Assessment of stochastic fail rate using E-beam massive metrology
2021
Wallace He
Camille Xu
Daniels Bae
K.-C. Chen
Andy Lan
Richer Yang
Abdalmohsen Elmalk
Aiqin Jiang
Fuming Wang
Double Chung
Shane Su
Kuo-Feng Pao
Oliver D. Patterson
Sudharshanan Raghunathan
Marc Kea
Jason Liao
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Photocathodes R&D for High Brightness and Highly Polarized Electron Beams at Cornell University
2018
Luca Cultrera
Jai Kwan Bae
Adam Bartnik
Ivan Bazarov
Rand Doane
Alice Galdi
Colwyn Gulliford
William Li
Jared Maxson
Sean McBride
Tobey Moore
Christopher M. Pierce
Camille Xu
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