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Ryan Ryoung han Kim
Ryan Ryoung han Kim
IMEC
Computer science
Extreme ultraviolet lithography
Optics
Measure (mathematics)
Physics
3
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2
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0
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Machine learning based recursive partitioning for simplifying OPC model building complexity
2021
Apoorva Oak
Soobin Hwang
Ruoxia Chen
Shinill Kang
Ryan Ryoung han Kim
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Electrically measurable test structures to capture and classify EUV stochastics
2019
Hemant Vats
Ryan Ryoung han Kim
Yasser Sherazi
Youssef Drissi
Kurt G. Ronse
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EUVL is being inserted in manufacturing in 2019: What are the mask related challenges remaining?
2019
Kurt G. Ronse
Rik Jonckheere
Emily Gallagher
Vicky Philipsen
Lieve Van Look
Eric Hendrickx
Ryan Ryoung han Kim
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