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Teresa A. Esposito
Teresa A. Esposito
Applied Materials
Magnification
Electronic engineering
Computer Aided Design
Feature Dimension
Engineering
4
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A holistic characterization methodology for stochastic printing failures in EUV contact holes
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Jennifer Church
Brad Austin
Luciana Meli
Alex Joseph Varghese
Teresa A. Esposito
DukKyun Moon
Nathaniel Mowell
Felix Levitov
Uri Smolyan
Omri Baum
Paz Yabbo
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Analysis of Systematic Weak Point Structures using Design Based Automatic Defect Classification and Defect Review SEM Platform
2020
ASMC | Advanced Semiconductor Manufacturing Conference
Teresa A. Esposito
Shih Hui Jen
Qian Xie
Danda Acharya
Julie Lee
Felix Levitov
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Integration of Computer-Aided Design (CAD) Information into a Defect-Review SEM Platform and Design Based Automatic Defect Classification : DI: Defect Inspection and Reduction
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Teresa A. Esposito
Jay Shah
A. Jain
Felix Levitov
John G. Sheridan
Shashi Shekhar
Shih Hui Jen
Victor Aristov
Hoang Nguyen
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Evidence for Direct Tunneling and Studies of the Electron Attenuation Coefficient in Porphyrin Molecular Junctions
2017
Teresa A. Esposito
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